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Kategorie:
Mikroskope

Art des Gerätes:
Dual-beam microscope (SEM/FIB)

Bezeichnung der übergeordneten Forschungsinfrastruktur (optional):
Helios NanoLab 600i

Zusätzliche Methoden und Synergien mit anderen Geräten (optional):
EDS, EBSD

Identifikationsnummer (optional):
helios-nanolab-600i

Kurze Beschreibung des Gerätes (maximal 5000 Zeichen):
This high resolution scanning electron microscope (SEM) is additionally equipped with a focused ion beam (FIB - liquid gallium source). With this ion beam it is possible to prepare micropillars for compression experiments as also to cut site specific lamella for transmission electron microscope (TEM) investigations. Prior to this, the samples can be characterized comprehensively by electron backscatter diffraction (EBSD) and energy-dispersive X-Ray spectroscopy (EDS) systems (both EDAX/ Ametek) in addition to the built-in detectors (SE and QBSD). By sweeping between electron and ion beam, suitable samples can also be analysed by EBSD and EDS in 3D, also in combination of both. Within the FIB, pre-prepared TEM-lamella can directly be investigated in STEM-mode (scanning transmission electron microscopy).

Hersteller:
Thermo Fisher Scientific (former FEI)

Jahr des Erwerbs (optional):
2030

Modell:

Notwendige / einschränkende Rahmenbedingungen für den Einsatz (optional):
Solid, conductive

Nutzergruppen:
Service + Operator

Art der Nutzung:
Internal + External

Fakultät:

• Faculty 5 – Georesources and Materials Engineering

Fachgruppe / Lehreinheit (optional):
Materials Science and Engineering

Institutskennziffer (IKZ):
Physical Metallurgy and Materials Physics

Website (optional)
https://www.imm.rwth-aachen.de/

Adresse (optional):
Kopernikusstr. 14, 52074 Aachen

Ansprechpartner*in:
Dr. Talal Al-Samman

E-Mailadresse (optional):
Alsamman@imm.rwth-aachen.de